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SPEA / 斯贝亚


     飞针测试机     双面晶圆探针及测试仪          半导体负载板块测试机      探针卡测试机 


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 全球精准度[敏感词],速度最快的飞针测试机   image.png

 □高达160次每秒的接触             

 □最小PAD尺寸: 50um              

 □ 8个 Multi-Jig 飞行头             

 □完整而全面的测试覆盖率           

 □花岗岩骨架                   

 □集约的占地面积: 2.2 m²            

 □非常易于使用的基于应用程序的软件      □机型:在线式,手动式抑或自动从储板   
装置里加载待测板式



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Tel:(86) 0755-2332 2685  

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Tel: (852) 2115 9252 

Sales Hotline: (86) 134 1880 1652
Email: sales@leaderinnova.com
 
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